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Leakage mechanism in ferroelectric Hf0.5Zr0.5O2 epitaxial thin films

Xianlong Cheng, Chao Zhou, Baichen Lin, Zhenni Yang, Shanquan Chen, Kelvin H. L. Zhang, Zuhuang Chen, Zuhuang Chen

2023Applied Materials Today24 citationsDOI

Topics & Concepts

FerroelectricityMaterials scienceMicroelectronicsOptoelectronicsThin filmLeakage (economics)EpitaxyHeterojunctionSchottky barrierAnnealing (glass)Schottky diodeNanotechnologyComposite materialDielectricMacroeconomicsDiodeLayer (electronics)EconomicsFerroelectric and Negative Capacitance DevicesMXene and MAX Phase MaterialsElectronic and Structural Properties of Oxides
Leakage mechanism in ferroelectric Hf0.5Zr0.5O2 epitaxial thin films | Litcius