Generative adversarial networks assisted machine learning based automated quantification of grain size from scanning electron microscope back scatter images
Amrutha Anantatamukala, K.V. Mani Krishna, Narendra B. Dahotre
Topics & Concepts
Artificial intelligenceSegmentationMaterials scienceElectron backscatter diffractionComputer sciencePattern recognition (psychology)Ground truthGrain sizeMachine learningMicrostructureMetallurgyNon-Destructive Testing TechniquesIntegrated Circuits and Semiconductor Failure AnalysisIndustrial Vision Systems and Defect Detection