Supervised and semi-supervised probabilistic learning with deep neural networks for concurrent process-quality monitoring
Kai Wang, Xiaofeng Yuan, Junghui Chen, Yalin Wang
Topics & Concepts
Computer scienceMachine learningProcess (computing)Artificial intelligenceAutoencoderQuality (philosophy)Probabilistic logicArtificial neural networkSupervised learningHyperparameterData miningOperating systemEpistemologyPhilosophyFault Detection and Control SystemsMineral Processing and GrindingAdvanced Data Processing Techniques