Investigation of interface trap charges and temperature variation in heterostacked-TFET
K. Vanlalawmpuia, Brinda Bhowmick
Topics & Concepts
Trap (plumbing)Variation (astronomy)Interface (matter)Materials scienceAtomic physicsPhysicsMeteorologyComposite materialAstrophysicsCapillary numberCapillary actionSemiconductor materials and devicesAdvancements in Semiconductor Devices and Circuit DesignIntegrated Circuits and Semiconductor Failure Analysis