Optimal plan for Wiener constant-stress accelerated degradation model
Peihua Jiang, Bing Xing Wang, Xiaofei Wang, Shuidan Qin
Topics & Concepts
Degradation (telecommunications)Reliability (semiconductor)QuantileConfidence intervalInterval (graph theory)Wiener processMathematicsConstant (computer programming)Limit (mathematics)Test planStress (linguistics)Accelerated life testingStatisticsMathematical optimizationApplied mathematicsComputer scienceEngineeringPower (physics)Weibull distributionMathematical analysisElectronic engineeringPhilosophyPhysicsLinguisticsQuantum mechanicsProgramming languageCombinatoricsReliability and Maintenance OptimizationLife Cycle Costing AnalysisProbabilistic and Robust Engineering Design