Origin and Suppression of Beam Damage-Induced Oxygen-K Edge Artifact from γ-Al2O3 using Cryo-EELS
Henry O. Ayoola, Cheng-Han Li, Stephen D. House, Cecile S. Bonifacio, Kim Kisslinger, Joerg R. Jinschek, Wissam A. Saidi, Judith C. Yang
Topics & Concepts
K-edgeEnhanced Data Rates for GSM EvolutionTransmission electron microscopyMaterials scienceCathode raySpectral lineBeam (structure)Analytical Chemistry (journal)Electron energy loss spectroscopyElectronOxygenMolecular physicsChemistryOpticsNanotechnologyAstronomyOrganic chemistryQuantum mechanicsPhysicsChromatographyTelecommunicationsComputer scienceHydrogen embrittlement and corrosion behaviors in metalsSemiconductor materials and devicesAdvanced Electron Microscopy Techniques and Applications