Litcius/Paper detail

Introducing “time-of-flight single particle investigator” (TOF-SPI): a tool for quantitative spICP-TOFMS data analysis

Alexander Gundlach‐Graham, Stasia Harycki, Sarah E. Szakas, Tristen L. Taylor, Hark Karkee, Raven L. Buckman Johnson, Shahnaz Mukta, Rui Hu, W. W. Lee

2024Journal of Analytical Atomic Spectrometry22 citationsDOIOpen Access PDF

Abstract

TOF-SPI is software for accurate, robust, and high-throughput analysis of single-particle ICP-TOFMS data.

Topics & Concepts

Time of flightParticle (ecology)ChromatographyChemistryBiologyEcologyX-ray Spectroscopy and Fluorescence AnalysisNuclear Physics and ApplicationsElectron and X-Ray Spectroscopy Techniques