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Analysis of interface roughness in strained InGaAs/AlInAs quantum cascade laser structures (λ ∼ 4.6 μm) by atom probe tomography

B. Knipfer, Shining Xu, Jeremy Kirch, D. Botez, L. J. Mawst

2022Journal of Crystal Growth19 citationsDOI

Topics & Concepts

Quantum cascade laserSurface finishSurface roughnessEpitaxyQuantum wellAtom probeLaserMaterials scienceCascadeDiffractionOptoelectronicsOpticsChemistryAlloyComposite materialPhysicsLayer (electronics)ChromatographySpectroscopy and Laser ApplicationsLaser-induced spectroscopy and plasmaAdvanced Materials Characterization Techniques
Analysis of interface roughness in strained InGaAs/AlInAs quantum cascade laser structures (λ ∼ 4.6 μm) by atom probe tomography | Litcius