One-shot device test data analysis using non-parametric and semi-parametric inferential methods and applications
Xiaojun Zhu, N. Balakrishnan
Topics & Concepts
Parametric statisticsComputer scienceParametric modelStatistical inferenceStatistical hypothesis testingMonte Carlo methodInferenceAlgorithmMathematicsStatisticsArtificial intelligenceStatistical Distribution Estimation and ApplicationsReliability and Maintenance OptimizationProbabilistic and Robust Engineering Design