Multi-frequency Fused Lock-in Thermography in Detecting Defects at Different Depths
Yanjie Wei, Yimin Ye, Hongjun He, Zhilong Su, Li Ding, Dongsheng Zhang
Topics & Concepts
ThermographyMaterials scienceOpticsAcousticsNondestructive testingExcitationPhase (matter)EmissivityCenter frequencyInfraredPhysicsQuantum mechanicsBand-pass filterThermography and Photoacoustic TechniquesInfrared Target Detection MethodologiesPhotoacoustic and Ultrasonic Imaging