Litcius/Paper detail

Remaining useful life prediction for multiple degradation indicators systems considering random correlation

Bin Wu, Jianchao Zeng, Hui Shi, Xiaohong Zhang, Yankai Qin

2023Computers & Industrial Engineering19 citationsDOI

Topics & Concepts

Degradation (telecommunications)CorrectnessKalman filterCorrelationSmoothingFault (geology)Computer scienceMaximizationAlgorithmReliability engineeringEngineeringMathematical optimizationMathematicsStatisticsArtificial intelligenceSeismologyGeologyGeometryTelecommunicationsReliability and Maintenance OptimizationRisk and Safety AnalysisSoftware Reliability and Analysis Research
Remaining useful life prediction for multiple degradation indicators systems considering random correlation | Litcius