A derivation of the electrical capacitance tomography sensitivity matrix
Robert C. Youngquist, Jedediah M. Storey, Mark A. Nurge, C. J. Biagi
Abstract
Abstract The sensitivity matrix, used in electrical capacitance tomography to connect capacitance readings to a dielectric distribution, is derived without assumptions on the magnitude of the relative permittivity and without dropping higher order terms. Deriving this matrix may provide a means to improve the performance of the various published electrical capacitance tomography algorithms and extend their applicability to a wider range of dielectric materials.
Topics & Concepts
CapacitanceElectrical capacitance tomographySensitivity (control systems)DielectricMatrix (chemical analysis)PermittivityMaterials scienceTomographyPhysicsElectronic engineeringOptoelectronicsOpticsComposite materialEngineeringElectrodeQuantum mechanicsElectrical and Bioimpedance TomographyGeophysical and Geoelectrical MethodsMicrofluidic and Bio-sensing Technologies