Residual stress determination in thin films by X-ray diffraction and the widespread analytical practice applying a biaxial stress model: An outdated oversimplification?
Peter Schoderböck, Harald Köstenbauer
Topics & Concepts
Residual stressMaterials scienceThin filmStress (linguistics)DiffractionComposite materialMolybdenumLayer (electronics)Hydrostatic equilibriumOpticsMetallurgyNanotechnologyPhysicsQuantum mechanicsLinguisticsPhilosophyMetal and Thin Film MechanicsAdvanced ceramic materials synthesisAdvanced Surface Polishing Techniques