Joint weakly and fully supervised learning for surface defect segmentation from images
Bin Hu, Xinggang Wang, Wenyong Yu
Topics & Concepts
SegmentationArtificial intelligenceComputer sciencePattern recognition (psychology)PixelSupervised learningJoint (building)Computer visionArtificial neural networkEngineeringArchitectural engineeringIndustrial Vision Systems and Defect DetectionIntegrated Circuits and Semiconductor Failure AnalysisAdvanced Neural Network Applications