Application of Electrochemical Atomic Force Microscopy (EC-AFM) in the Corrosion Study of Metallic Materials
Hanbing Chen, Zhenbo Qin, Meifeng He, Yichun Liu, Zhong Wu
Abstract
Electrochemical atomic force microscopy (EC-AFM), a branch of a scanning probe microscopy (SPM), can image substrate topography with high resolution. Since its inception, it was extended to a wide range of research areas through continuous improvement. The presence of an electrolytic cell and a potentiostat makes it possible to observe the topographical changes of the sample surface in real time. EC-AFM is used in in situ corrosion research because the samples are not required to be electrically conductive. It is widely used in passive film properties, surface dissolution, early-stage corrosion initiation, inhibitor efficiency, and many other branches of corrosion science. This review provides the research progress of EC-AFM and summarizes the extensive applications and investigations using EC-AFM in corrosion science.