Effects of BOX thickness, silicon thickness, and backgate bias on SCE of ET-SOI MOSFETs
Elizabeth Mei-hua Su, David Hong, S. Cristoloveanu, Yuan Taur
Topics & Concepts
Silicon on insulatorSiliconMaterials scienceMOSFETThreshold voltageReverse short-channel effectShort-channel effectOptoelectronicsVoltageElectronic engineeringElectrical engineeringTransistorEngineeringSemiconductor materials and devicesAdvancements in Semiconductor Devices and Circuit DesignSilicon Carbide Semiconductor Technologies