Fully convolutional networks for chip-wise defect detection employing photoluminescence images
Maike Lorena Stern, Martin Schellenberger
Topics & Concepts
PhotoluminescencePixelBrightnessComputer scienceChipArtificial intelligenceWaferOptoelectronicsMaterials scienceComputer visionOpticsTelecommunicationsPhysicsIndustrial Vision Systems and Defect DetectionAdvanced Neural Network ApplicationsImage Enhancement Techniques