Charge carrier dynamics of surface back electron/hole recombination in BiVO<sub>4</sub> and TiO<sub>2</sub> photoanodes
Wenjun Zhu, Yuling Yuan, Yimeng Ma
Abstract
Surface back electron/hole recombination limits the water oxidation efficiency in BiVO 4 due to slow water oxidation and fast recombination. TiO 2 is less affected due to faster water oxidation that avoids surface recombination.
Topics & Concepts
RecombinationElectronMaterials scienceCharge carrierSurface (topology)Chemical physicsOptoelectronicsCharge (physics)Surface statesSurface chargeChemistryPhysicsPhysical chemistryMathematicsQuantum mechanicsGeneBiochemistryGeometryAdvanced Photocatalysis TechniquesCopper-based nanomaterials and applicationsGa2O3 and related materials