Quantitative model for grain boundary effects on strength-electrical conductivity relation
J.P. Hou, Xiaotao Li, Shuo Wang, Xueyuan Fan, Cheng‐Hui Li, Wang Qiang, Zhenjun Zhang, Zhefeng Zhang
Topics & Concepts
Materials scienceGrain boundaryElectrical resistivity and conductivityRelation (database)ConductivityComposite materialThermodynamicsMicrostructureData miningPhysical chemistryChemistryPhysicsEngineeringComputer scienceElectrical engineeringMicrostructure and mechanical propertiesMicrostructure and Mechanical Properties of SteelsAluminum Alloy Microstructure Properties