Photoresists based on bisphenol A derivatives with tert-butyl ester groups for electron beam lithography
Shengwen Hu, Jinping Chen, Tianjun Yu, Yi Zeng, Xudong Guo, Shuangqing Wang, Guoqiang Yang, Yi Li
Topics & Concepts
ResistPhotoresistBisphenol ALithographyChemistryElectron-beam lithographyPolymer chemistryMaterials sciencePhotochemistryOrganic chemistryOptoelectronicsEpoxyLayer (electronics)Advancements in Photolithography TechniquesNanofabrication and Lithography TechniquesIntegrated Circuits and Semiconductor Failure Analysis