A Systematic Bit Selection Method for Robust SRAM PUFs

Wendong Wang, Adit D. Singh, Ujjwal Guin

2022Journal of Electronic Testing14 citationsDOI

Topics & Concepts

Static random-access memoryElectronic engineeringChipPower (physics)Noise (video)Key (lock)Computer scienceEngineeringEmbedded systemElectrical engineeringPhysicsArtificial intelligenceImage (mathematics)Quantum mechanicsComputer securityPhysical Unclonable Functions (PUFs) and Hardware SecurityIntegrated Circuits and Semiconductor Failure AnalysisAdvanced Memory and Neural Computing