Single-defect phonons imaged by electron microscopy
Xingxu Yan, Chengyan Liu, Chaitanya Gadre, Lei Gu, Toshihiro Aoki, Tracy C. Lovejoy, Niklas Dellby, Ondrej L. Krivanek, Darrell G. Schlom, Ruqian Wu, Xiaoqing Pan
Topics & Concepts
PhononMaterials scienceThermal diffusivityCondensed matter physicsThermal conductivityMolecular physicsStacking faultCrystal (programming language)SpectroscopyTransmission electron microscopyScatteringElectron energy loss spectroscopyOpticsNanotechnologyChemistryPhysicsDislocationComposite materialProgramming languageComputer scienceQuantum mechanicsThermal properties of materialsForce Microscopy Techniques and ApplicationsThermography and Photoacoustic Techniques