Relation between sampling, sensitivity and precision in strain mapping using the Geometric Phase Analysis method in Scanning Transmission Electron Microscopy
Alexandre Pofelski, Yimei Zhu, Gianluigi A. Botton
Topics & Concepts
Sensitivity (control systems)Scanning transmission electron microscopyCharacterization (materials science)OpticsFourier transformSampling (signal processing)Phase (matter)Noise (video)Materials sciencePhysicsBiological systemMathematicsComputer scienceTransmission electron microscopyMathematical analysisArtificial intelligenceImage (mathematics)EngineeringElectronic engineeringBiologyDetectorQuantum mechanicsOptical measurement and interference techniquesAdvanced X-ray Imaging TechniquesMagnetic Properties and Applications