Event driven 4D STEM acquisition with a Timepix3 detector: Microsecond dwell time and faster scans for high precision and low dose applications
Daen Jannis, Christoph K. Hofer, Chuang Gao, X. Xie, Armand Béché, Timothy J. Pennycook, Johan Verbeeck
Topics & Concepts
DetectorBottleneckOpticsMicrosecondDwell timePhysicsScanning transmission electron microscopyFrame rateComputer scienceTransmission electron microscopyEmbedded systemClinical psychologyMedicineAdvanced Electron Microscopy Techniques and ApplicationsElectron and X-Ray Spectroscopy TechniquesAdvanced X-ray Imaging Techniques