Data-driven reliability-based topology optimization by using the extended multi scale finite element method and neural network approach
Zeng Meng, Shunsheng Lv, Yongxin Gao, Changting Zhong, Kang An
Topics & Concepts
Finite element methodTopology optimizationArtificial neural networkReliability (semiconductor)Scale (ratio)Topology (electrical circuits)Extended finite element methodComputer scienceMixed finite element methodApplied mathematicsMathematicsMathematical optimizationStructural engineeringEngineeringArtificial intelligencePhysicsQuantum mechanicsCombinatoricsPower (physics)Topology Optimization in EngineeringProbabilistic and Robust Engineering DesignConcrete Corrosion and Durability