Radiation and annealing related effects in NBT stressed P-channel power VDMOSFETs
Danijel Danković, V. Davidović, S. Golubović, Sandra Veljković, Nikola Mitrović, S. Djoric-Veljković
Topics & Concepts
Annealing (glass)IrradiationMaterials scienceThreshold voltageStress (linguistics)RadiationOptoelectronicsVoltageComposite materialElectrical engineeringOpticsPhysicsTransistorEngineeringPhilosophyNuclear physicsLinguisticsSemiconductor materials and devicesAdvancements in Semiconductor Devices and Circuit DesignIntegrated Circuits and Semiconductor Failure Analysis