Avoiding common errors in X-ray photoelectron spectroscopy data collection and analysis, and properly reporting instrument parameters
Joshua W. Pinder, George H. Major, Donald R. Baer, Jeff Terry, James E. Whitten, Jan Čechal, Jacob Crossman, Alvaro J. Lizarbe, Samira Jafari, Christopher D. Easton, Jonas Baltrušaitis, M. A. Van Spronsen, Matthew R. Linford
Abstract
Despite numerous tutorials and standards written to the technical community on X-ray photoelectron spectroscopy (XPS), difficulties with data acquisition, analysis, and reporting persist. This work focuses on common errors in XPS that are frequently observed in the scientific literature and their sources. Indeed, this work covers: (i) XPS data collection, initial data analysis, and data presentation, (ii) Handling XPS backgrounds, (iii) Common errors in XPS peak fitting, and (iv) XPS data presentation and reporting. Graphical examples of errors and appropriate ways of handling data and correcting errors are provided. Additional readings are listed for greater in-depth exploration of the subjects discussed.