Assessment of trapping layer control in IGZO/Al2O3/Ga2O3 synaptic transistor for neuromorphic computing
Eun Seo Jo, You Seung Rim
Topics & Concepts
Neuromorphic engineeringMaterials scienceTransistorInitializationOptoelectronicsBistabilityTrappingNonlinear systemQuantum tunnellingLinearityVoltageSemiconductorLayer (electronics)NanotechnologyElectronic engineeringArtificial neural networkComputer scienceElectrical engineeringArtificial intelligencePhysicsBiologyQuantum mechanicsEngineeringProgramming languageEcologyAdvanced Memory and Neural ComputingThin-Film Transistor TechnologiesCCD and CMOS Imaging Sensors