Hysteresis modeling with frequency-separation-based Gaussian process and its application to sinusoidal scanning for fast imaging of atomic force microscope
Yidan Tao, Han‐Xiong Li, Li-Min Zhu
Topics & Concepts
ScannerComputer scienceMicroscopeRaster scanHysteresisGaussianProcess (computing)Gaussian processControl theory (sociology)AcousticsOpticsArtificial intelligencePhysicsControl (management)Operating systemQuantum mechanicsPiezoelectric Actuators and ControlForce Microscopy Techniques and ApplicationsAdvanced Measurement and Metrology Techniques