Litcius/Paper detail

Analytical modeling of thermo-mechanical stress for bond wire of IGBT module

Xingyu Dai, Xin Yang, Xinlong Wu, Chunming Tu, Guoyou Liu

2021Microelectronics Reliability19 citationsDOI

Topics & Concepts

Wire bondingInsulated-gate bipolar transistorFinite element methodStructural engineeringStress (linguistics)BondMaterials scienceReliability (semiconductor)Displacement (psychology)Power (physics)Mechanical engineeringEngineeringElectrical engineeringVoltagePhysicsPhilosophyChipPsychotherapistQuantum mechanicsPsychologyLinguisticsFinanceEconomicsSilicon Carbide Semiconductor TechnologiesThin-Film Transistor TechnologiesSilicon and Solar Cell Technologies