Uncertain random accelerated degradation modelling and statistical analysis with aleatory and epistemic uncertainties from multiple dimensions
Wen-Bin Chen, Xiaoyang Li, Jipeng Wu, Rui Kang
Topics & Concepts
Uncertainty quantificationReliability (semiconductor)Degradation (telecommunications)Dimension (graph theory)Uncertainty analysisComputer scienceMathematicsReliability engineeringEngineeringStatisticsQuantum mechanicsPure mathematicsPhysicsTelecommunicationsPower (physics)Reliability and Maintenance OptimizationStatistical Distribution Estimation and ApplicationsProbabilistic and Robust Engineering Design