A two-step in situ measurement method for temperature and thermal stress of power device based on a single Raman peak
Yupu Li, Aoran Fan, Xiaoyu Zhang, Xiaoyu Zhang, Xing Zhang, Xing Zhang
Topics & Concepts
Materials scienceDecoupling (probability)Raman spectroscopyStress (linguistics)Temperature measurementCalibrationThermodynamicsOpticsPhysicsLinguisticsControl engineeringEngineeringQuantum mechanicsPhilosophySilicon Carbide Semiconductor TechnologiesGaN-based semiconductor devices and materialsAdvancements in Semiconductor Devices and Circuit Design