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Internal loss of AlGaN-based ultraviolet-B band laser diodes with p-type AlGaN cladding layer using polarization doping

Tomoya Omori, Sayaka Ishizuka, Shunya Tanaka, Shinji Yasue, Kosuke Sato, Yuya Ogino, Shohei Teramura, Kazuki Yamada, Sho Iwayama, Hideto Miyake, Motoaki Iwaya, Tetsuya Takeuchi, Satoshi Kamiyama, Isamu Akasaki

2020Applied Physics Express47 citationsDOI

Abstract

Aluminum gallium nitride (AlGaN)-based ultraviolet-B band laser diodes (LDs) with a p-type AlGaN cladding layer using polarization doping were fabricated on lattice-relaxed Al0.6Ga0.4N/AlN/sapphire. The threshold current density Jth and lasing wavelength of this LD were 25 kA cm−2 and 298 nm, respectively. The internal loss (αi) was estimated by means of a variable stripe length method using optical excitation. The αi value of this LD was relatively low (i.e. <10 cm−1), thus suggesting that the device is characterized by both, proper light confinement and low internal loss.

Topics & Concepts

Materials scienceOptoelectronicsCladding (metalworking)SapphireDopingLasing thresholdDiodeUltravioletLaserWavelengthLight-emitting diodePolarization (electrochemistry)OpticsChemistryPhysical chemistryPhysicsMetallurgyGaN-based semiconductor devices and materialsGa2O3 and related materialsZnO doping and properties
Internal loss of AlGaN-based ultraviolet-B band laser diodes with p-type AlGaN cladding layer using polarization doping | Litcius