PVP-SiO2 and PVP-TiO2 hybrid films for dielectric gate applications in CdS-based thin film transistors
M.S. de Urquijo-Ventura, M.G. Syamala Rao, Susana Meraz-Davila, Jorge Alejandro Torres-Ochoa, Manuel Quevedo-López, R. Ramı́rez-Bon
Topics & Concepts
Materials scienceDielectricX-ray photoelectron spectroscopyGate dielectricThin filmThreshold voltageThin-film transistorSurface roughnessContact angleOptoelectronicsAnalytical Chemistry (journal)Chemical engineeringNanotechnologyTransistorComposite materialLayer (electronics)VoltageOrganic chemistryChemistryElectrical engineeringEngineeringFerroelectric and Piezoelectric MaterialsSemiconductor materials and devicesConducting polymers and applications