Nanoscale characterization of crystalline and amorphous phases in silicon oxycarbide ceramics using 4D-STEM
Ni Yang, Colin Ophus, Benjamin H. Savitzky, Mary Scott, Karen C. Bustillo, Kathy Lu
Topics & Concepts
Materials scienceCharacterization (materials science)CeramicAmorphous solidNanoscopic scaleNanometreNanotechnologyDiffractionAmorphous siliconSiliconSelected area diffractionCrystalline siliconComposite materialCrystallographyOptoelectronicsOpticsTransmission electron microscopyPhysicsChemistryAdvanced ceramic materials synthesisSemiconductor materials and devicesSilicon Carbide Semiconductor Technologies