Comparing bulk-Si FinFET and gate-all-around FETs for the 5 nm technology node
Vinay Vashishtha, Lawrence T. Clark
Topics & Concepts
Subthreshold conductionNode (physics)TransistorCMOSMaterials scienceSubthreshold slopeStatic random-access memoryLogic gateMOSFETOptoelectronicsTechnology CADElectronic engineeringSpiceGate equivalentField-effect transistorElectronic circuitElectrical engineeringGate oxideEngineeringVoltageStructural engineeringEngineering drawingCADAdvancements in Semiconductor Devices and Circuit DesignSemiconductor materials and devicesIntegrated Circuits and Semiconductor Failure Analysis