Improved EBSD indexation accuracy by considering energy distribution of diffraction patterns
Qiwei Shi, Liyao Jiao, Dominique Loisnard, Chengyi Dan, Zhe Chen, Haowei Wang, Stéphane Roux
Topics & Concepts
Electron backscatter diffractionMaterials scienceDiffractionComputational physicsWeightingOpticsPhysicsAcousticsElectron and X-Ray Spectroscopy TechniquesNon-Destructive Testing TechniquesAdvancements in Photolithography Techniques