Direct imaging of atomistic grain boundary migration
Jiake Wei, Bin Feng, Ryo Ishikawa, Tatsuya Yokoi, Katsuyuki Matsunaga, Naoya Shibata, Yuichi Ikuhara
Topics & Concepts
Grain boundaryMetastabilityAtomic unitsMaterials scienceCrystalliteTransmission electron microscopyChemical physicsScanning transmission electron microscopyMicrostructureCrystallographyDirect imagingNanoscopic scaleNanotechnologyChemistryOpticsPhysicsComposite materialMetallurgyQuantum mechanicsOrganic chemistryMicrostructure and mechanical propertiesIon-surface interactions and analysisFusion materials and technologies