Microscopy analysis neural network to solve detection, enumeration and segmentation from image-level annotations
Anthony Bilodeau, Constantin V. L. Delmas, Martin Parent, Paul De Koninck, Audrey Durand, Flavie Lavoie‐Cardinal
Topics & Concepts
Computer scienceArtificial intelligenceSegmentationArtificial neural networkPattern recognition (psychology)AnnotationTask (project management)Feature (linguistics)Deep learningMicroscopyMachine learningLinguisticsOpticsPhilosophyEconomicsManagementPhysicsCell Image Analysis TechniquesImage Processing Techniques and ApplicationsAdvanced Electron Microscopy Techniques and Applications