A novel fault diagnosis method for analog circuits with noise immunity and generalization ability
Tianyu Gao, Jingli Yang, Shouda Jiang
Topics & Concepts
Computer scienceAutoencoderPattern recognition (psychology)Artificial intelligenceAnalogue electronicsFault (geology)Dimensionality reductionSupport vector machineFeature extractionFeature vectorNoise (video)Noise reductionCluster analysisElectronic circuitArtificial neural networkEngineeringSeismologyImage (mathematics)Electrical engineeringGeologyIntegrated Circuits and Semiconductor Failure AnalysisVLSI and Analog Circuit TestingIndustrial Vision Systems and Defect Detection