Reliability assessment of SiC power MOSFETs in dynamic reverse bias test
Alessandro Sitta, Giuseppe Mauromicale, M. Fiore, Michele Calabretta
Topics & Concepts
Reliability engineeringReliability (semiconductor)Reverse biasPower (physics)Test (biology)Computer scienceElectrical engineeringEngineeringPhysicsVoltageQuantum mechanicsPaleontologyBiologySilicon Carbide Semiconductor TechnologiesSemiconductor materials and devicesElectromagnetic Compatibility and Noise Suppression