Decision fusion approach for detecting unknown wafer bin map patterns based on a deep multitask learning model
Jaeyeon Jang, Gyeong Taek Lee
Topics & Concepts
Computer scienceArtificial intelligenceRandom forestAutoencoderSoftmax functionPattern recognition (psychology)Classifier (UML)Convolutional neural networkDeep learningMachine learningData miningReceiver operating characteristicIndustrial Vision Systems and Defect DetectionImage Processing Techniques and ApplicationsIntegrated Circuits and Semiconductor Failure Analysis