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Interaction-Free Measurement with Electrons

Amy E. Turner, Cameron Johnson, P. Kruit, Benjamin McMorran

2021Physical Review Letters46 citationsDOIOpen Access PDF

Abstract

Here, we experimentally demonstrate interaction-free measurements with electrons using a novel electron Mach-Zehnder interferometer. The flexible two-grating electron interferometer is constructed in a conventional transmission electron microscope and achieves high contrast in discrete output detectors, tunable alignment with independently movable beam splitters, and scanning capabilities for imaging. With this path-separated electron interferometer, which closely matches theoretical expectations, we demonstrate electron interaction-free measurements with an efficiency of 14±1%. Implementing this quantum protocol in electron imaging opens a path toward interaction-free electron microscopy.

Topics & Concepts

InterferometryElectronPhysicsOpticsFree electron modelMach–Zehnder interferometerScanning transmission electron microscopyBeam splitterElectron microscopeMean free pathLaserQuantum mechanicsAdvanced Electron Microscopy Techniques and ApplicationsSurface and Thin Film PhenomenaForce Microscopy Techniques and Applications
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