A new multiplexed system for the simultaneous measurement of out-of-plane deformation and its first derivative
Qihan Zhao, Xiao Zhang, Shuangle Wu, Huanqing Wang, Peizheng Yan, Yonghong Wang
Topics & Concepts
OpticsInterferometryShearing (physics)Mach–Zehnder interferometerShearing interferometerInterference (communication)Reference beamMultiplexingPhysicsPolarization (electrochemistry)Beam (structure)Astronomical interferometerMaterials scienceComputer scienceTelecommunicationsChannel (broadcasting)ChemistryPhysical chemistryThermodynamicsAdvanced Fiber Optic SensorsOptical measurement and interference techniquesAdvanced Measurement and Metrology Techniques