The effect of thickness on surface structure of rf sputtered TiO2 thin films by XPS, SEM/EDS, AFM and SAM
Feyza Güzelçimen, Bükem Tanören, Çağlar Çetinkaya, Meltem Dönmez Kaya, Halil İbrahim Efkere, Yunus Özen, Doǧukan Bingöl, Merve Sirkeci, Barış Kınacı, Mehmet Burçin Ünlü, Süleyman Özçelik
Topics & Concepts
X-ray photoelectron spectroscopyMaterials scienceScanning electron microscopeSurface roughnessSubstrate (aquarium)Thin filmAnalytical Chemistry (journal)Surface finishSputter depositionSpectroscopyMicrometerSputteringOpticsNanotechnologyChemistryComposite materialNuclear magnetic resonancePhysicsChromatographyGeologyOceanographyQuantum mechanicsElectronic and Structural Properties of OxidesAnalytical Chemistry and SensorsSurface Roughness and Optical Measurements