Litcius/Paper detail

The probe of current conduction mechanisms, interface states, and the forward bias intersection point of the al/Al2O3/Ge/p-Si heterostructures depending on temperature

Buket Akın, Sabreen A. Hameed, Seçkin Altındal Yerişkin, Murat Ulusoy, Haziret Durmuş

2024Materials Science in Semiconductor Processing18 citationsDOI

Topics & Concepts

Materials scienceIntersection (aeronautics)HeterojunctionThermal conductionCurrent (fluid)Condensed matter physicsPoint (geometry)Interface (matter)OptoelectronicsThermodynamicsPhysicsComposite materialGeometryAerospace engineeringEngineeringMathematicsCapillary numberCapillary actionSemiconductor materials and interfacesIntegrated Circuits and Semiconductor Failure AnalysisSemiconductor materials and devices
The probe of current conduction mechanisms, interface states, and the forward bias intersection point of the al/Al2O3/Ge/p-Si heterostructures depending on temperature | Litcius