Deep metric learning for few-shot image classification: A Review of recent developments
Xiaoxu Li, Xiaochen Yang, Zhanyu Ma, Jing-Hao Xue
Topics & Concepts
Artificial intelligenceComputer scienceOverfittingConvolutional neural networkDeep learningMachine learningCategorizationContextual image classificationMetric (unit)Pattern recognition (psychology)EmbeddingImage (mathematics)Artificial neural networkOperations managementEconomicsDomain Adaptation and Few-Shot LearningViral Infections and Outbreaks ResearchCOVID-19 diagnosis using AI