Burr-type NHPP-based software reliability models and their applications with two type of fault count data
Siqiao Li, Tadashi Dohi, Okamura Hiroyuki
Topics & Concepts
Goodness of fitComputer sciencePoisson processSoftware qualityStatisticsSoftwareFault (geology)Reliability (semiconductor)Type (biology)Reliability engineeringPoisson distributionData miningMathematicsSoftware developmentEngineeringProgramming languageEcologyBiologyPhysicsQuantum mechanicsGeologySeismologyPower (physics)Software Reliability and Analysis ResearchReliability and Maintenance OptimizationStatistical Distribution Estimation and Applications