Data-driven optimization of accessory combinations for final testing processes in semiconductor manufacturing
Shu‐Kai S. Fan, Wei-Kai Lin, Chih‐Hung Jen
Topics & Concepts
Categorical variableHeuristicProcess (computing)Yield (engineering)Semiconductor device fabricationEmbeddingComputer scienceMachine learningArtificial intelligenceEngineeringElectrical engineeringOperating systemMetallurgyWaferMaterials scienceIndustrial Vision Systems and Defect DetectionManufacturing Process and OptimizationIntegrated Circuits and Semiconductor Failure Analysis