Direct ellipsometry for non-destructive characterization of interfacially-polymerized thin-film composite membranes
Wojciech Ogieglo, Jaime A. Idarraga-Mora, Scott M. Husson, Ingo Pinnau
Topics & Concepts
EllipsometryMembraneMaterials scienceInterfacial polymerizationThin-film composite membraneLayer (electronics)Chemical engineeringComposite numberCharacterization (materials science)Reverse osmosisScanning electron microscopePolymerizationThin filmComposite materialNanotechnologyPolymerChemistryMonomerEngineeringBiochemistryMembrane Separation TechnologiesElectrohydrodynamics and Fluid DynamicsMicroplastics and Plastic Pollution